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3D-optisch meetsysteem voor halfgeleidermetrologie

3D-optisch meetsysteem voor halfgeleidermetrologie

Gantry-Mounted 3D Optical Measuring System for Semiconductor Metrology (Darco) Precision Coordinate Measuring Machines MXP coordinate measuring machines deliver the precise and rapid measurements essential for quality assurance. Our CMMs provide accurate 3D measurements for both contact and non-contact applications, utilizing probes to collect workpiece data that is then analyzed by sophisticated measurement software for comprehensive inspection. Ideal for demanding

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